Product Description:
The Atomic Force Microscope (AFM) is a cutting-edge nanoscale characterization platform designed to provide unparalleled precision and versatility in surface analysis. With a sample size capacity of up to 25 mm, this instrument is ideal for investigating a wide range of materials and structures at the nanoscale, making it an essential tool for researchers and engineers across various scientific disciplines.
One of the standout features of this AFM is its exceptional imaging capability, boasting a maximum resolution of 4096*4096 sampling points for the scanning probe image. This ultra-high resolution ensures that even the finest surface details can be accurately captured and analyzed, enabling detailed topographical mapping and comprehensive surface characterization at the nanoscale.
The AFM supports multiple working modes, providing users with a highly flexible and customizable analysis experience. These modes include Contact Mode, Tap Mode, Phase Imaging Mode, Lift Mode, and Multi-directional Scanning Mode. Each mode offers unique advantages, allowing the instrument to adapt to different sample types and measurement requirements. For instance, Contact Mode enables direct interaction with the sample surface for precise height measurements, while Tap Mode reduces sample damage by intermittently contacting the surface. Phase Imaging Mode adds the ability to investigate material properties by detecting variations in phase shifts, and Lift Mode facilitates non-contact imaging by maintaining a constant distance from the sample surface. The Multi-directional Scanning Mode enhances data acquisition by enabling scans from various orientations, improving the overall accuracy and detail of the analysis.
The scanning method utilized by this AFM involves XYZ three-axis full sample scanning, which ensures comprehensive coverage and precise positioning during measurements. This three-dimensional scanning capability allows the system to meticulously navigate the sample surface in all directions, capturing detailed information across the entire scanned area. Such comprehensive scanning is critical for generating accurate 3D surface profiles and for investigating complex nanoscale features that may vary across different regions of a sample.
In terms of mechanical performance, the AFM demonstrates outstanding precision with nonlinearity values of just 0.15% in the XY direction and 1% in the Z direction. This low level of nonlinearity translates to highly accurate positioning and reliable measurement data, which are crucial for nanoscale characterization tasks where minute deviations can significantly impact results. The stability and precision offered by this instrument enable users to conduct repeatable and trustworthy analyses, essential for both research and industrial applications.
Moreover, the AFM incorporates non-contact measurement capabilities, which are vital for analyzing delicate or soft samples without causing damage. This non-contact feature enhances the instrument's versatility, allowing it to be used in applications where preserving the integrity of the sample surface is paramount. By minimizing physical interaction, the AFM can effectively characterize sensitive materials such as biological specimens, polymers, and thin films.
In summary, this Atomic Force Microscope stands out as a powerful nanoscale characterization platform equipped with multiple modes and advanced scanning technology. Its large sample capacity, ultra-high resolution imaging, versatile working modes, precise XYZ scanning, and low nonlinearity make it an indispensable instrument for detailed surface analysis. Whether you require contact or non-contact measurement methods, this AFM provides the flexibility and accuracy needed to uncover the intricate details of nanoscale structures, supporting a wide range of scientific investigations and technological developments.
Features:
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Product Name: Atomic Force Microscope
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Scanning Range: 100 μm * 100 μm * 10 μm
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Image Sampling Point: Maximum resolution of the scanning probe image is 4096 * 4096
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Scanning Method: XYZ three-axis full sample scanning
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Nonlinearity: 0.15% in the XY direction and 1% in the Z direction
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Working Modes: Contact Mode, Tap Mode, Phase Imaging Mode, Lift Mode, Multi-directional Scanning Mode
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Enables high precision SPM (Scanning Probe Microscopy) for detailed surface property mapping
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Achieves nanometer resolution for accurate nanoscale imaging and analysis
Technical Parameters:
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Scanning Range
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100 μm * 100 μm * 10 μm
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Noise Level In The Z Direction
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0.04 Nm
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Working Mode
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Contact Mode, Tap Mode, Phase Imaging Mode, Lift Mode, Multi-directional Scanning Mode
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Sample Size
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25 mm
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Multifunctional Measurement
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Electrostatic Force Microscope (EFM), Scanning Kelvin Microscope (KPFM), Piezoelectric Force Microscope (PFM), Magnetic Force Microscope (MFM), Force Curve
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Scanning Method
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XYZ Three-axis Full Sample Scanning
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Image Sampling Point
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The Maximum Resolution Of The Scanning Probe Image Is 4096 * 4096
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Scanning Rate
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0.1 - 30 Hz
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Nonlinearity
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0.15% In The XY Direction And 1% In The Z Direction
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Applications:
The Truth Instruments AtomEdge Pro Atomic Force Microscope, originating from China, is a state-of-the-art instrument designed for precise and multifunctional surface analysis. Its advanced capabilities make it ideal for a wide range of product application occasions and scenarios, catering to both research and industrial needs.
Thanks to its multifunctional measurement modes, including Electrostatic Force Microscope (EFM), Scanning Kelvin Probe Force Microscope (KPFM), Piezoelectric Force Microscope (PFM), Magnetic Force Microscope (MFM), and Force Curve measurements, the AtomEdge Pro offers unparalleled versatility. This allows users to perform comprehensive surface characterization by switching seamlessly between multiple modes, enabling detailed analysis of electrical, magnetic, piezoelectric, and mechanical properties of materials.
One of the key application scenarios for the AtomEdge Pro is in the field of nanotechnology research, where non-contact scanning is critical to avoid damaging delicate samples. The microscope’s non-contact operation mode ensures that the surface morphology and properties are accurately measured without physical interference, making it perfect for analyzing biological samples, polymers, semiconductors, and nanostructured materials.
Industries such as electronics, materials science, and energy storage benefit greatly from the AtomEdge Pro’s precise surface analysis capabilities. Its XYZ three-axis full sample scanning method combined with a maximum resolution of 4096*4096 image sampling points allows for high-definition imaging and detailed topographical mapping of surfaces up to 25 mm in size. This makes it an excellent tool for quality control, failure analysis, and material development.
Moreover, the instrument’s low noise level in the Z direction, at just 0.04 nm, guarantees high sensitivity and stability during measurements, which is essential for detecting subtle surface variations and conducting force curve experiments. This attribute enhances its applicability in scientific laboratories and industrial environments where precision is paramount.
In summary, the Truth Instruments AtomEdge Pro Atomic Force Microscope is perfectly suited for scenarios that demand non-contact, high-resolution surface analysis across multiple modes. Whether it is for academic research, innovative material development, or rigorous industrial inspection, this advanced AFM model delivers reliable and multifunctional measurement capabilities to meet diverse analytical challenges.
Support and Services:
Our Atomic Force Microscope (AFM) product is supported by a dedicated team of technical experts committed to ensuring optimal performance and customer satisfaction. We offer comprehensive technical support services including installation assistance, operational training, routine maintenance guidance, and troubleshooting.
Users can access detailed user manuals, software updates, and calibration procedures to maintain the accuracy and reliability of the AFM. Our support team provides remote diagnostics and on-site service options to quickly resolve any technical issues.
Additionally, we offer customized training programs tailored to different levels of expertise, helping users to maximize the capabilities of their Atomic Force Microscope. Preventative maintenance services are also available to extend the lifespan of your instrument and ensure consistent performance.
For research and development needs, our specialists provide consultation services to optimize AFM configurations and applications specific to your scientific objectives. We are committed to continuous improvement and welcome user feedback to enhance our products and services.
FAQ:
Q1: What is the brand and model of this Atomic Force Microscope?
A1: The Atomic Force Microscope is branded as Truth Instruments and the model number is AtomEdge Pro.
Q2: Where is the AtomEdge Pro manufactured?
A2: The AtomEdge Pro Atomic Force Microscope is manufactured in China.
Q3: What applications is the AtomEdge Pro suitable for?
A3: The AtomEdge Pro is ideal for high-resolution surface imaging and measurement in fields such as materials science, biology, and nanotechnology.
Q4: What is the resolution capability of the AtomEdge Pro?
A4: The AtomEdge Pro offers atomic-level resolution, allowing detailed surface topography analysis at the nanoscale.
Q5: Does the AtomEdge Pro support multiple scanning modes?
A5: Yes, the AtomEdge Pro supports various scanning modes including contact mode, tapping mode, and non-contact mode to accommodate different sample types and imaging requirements.
